Upcoming Webinar - June 2nd
"Combining the Power of Functional Test with Embedded System Access"
 Dear <<First Name>>,
one of the most serious problems in the area of testing is the continuous decline in physical access. Across a range of markets, users unanimously report reduction in test access of up to 20% within the last 5 years, which inevitably leads to discussions on test methods that can be used in future. While JTAG / boundary scan has gained a good reputation in this context, this test methodology alone cannot provide a solution to all problems either - complementary test technologies are still needed for future board and system designs. This webinar first analyses some fundamental aspects of combining JTAG / boundary scan and functional test and then introduces new approaches for embedded functional test, as well as their practical implementation.
Attend this one hour live webinar (including question and answer session) to get answers to questions such as:
- How can limitations of functional test and structural test be overcome by combining these test techniques?
- What kind of functional test coverage can be achieved by traditional structural test techniques, and what enhancements can more modern embedded test strategies offer
- How can we automate functional test development and achieve deterministic fault coverage for functional test?
Intrigued? Attend our upcoming webinar
on June 2nd, at 11 AM CDT, 9 AM PDT (16:00 UTC).
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