The Burn-in & Test Strategies (BiTS) Workshop is pleased to announce that the BiTS 2017 "Attendee Choice" award goes to James Tong of Texas Instruments. His presentation "Coming to terms with Burn-In sockets" was selected by the professional attendees from among the thirty-two excellent presentations at this year's BiTS. This award is driven directly by the feedback forms submitted and analyzed post-event. Congratulations James!
And congratulations to all the BiTS 2017 award winners:
| Category |
Title |
Author(s) |
| Best Presentation |
Contactor Based Final Test at 77 GHz on a Multi-Channel Radar Transceiver Chipset |
Brian Nakai & Jeffrey Finder – NXP Semiconductors |
Best
Data |
High Current Final Test Contactor Development |
Thiha Shwe & Hisashi Ata - Texas Instruments
Kenichi Sato - Yokowo |
| Most Inspirational |
New Possiblity with Coax Via Risers |
Matthew Priolo, Adrian Rodriquez, Christopher Kinney, & Adewale Oladeinde – Intel Corporation |
| Most Educational |
Flat Probe Technology For High Frequency Test |
Jason Mroczkowski & Nadia Steckler - Xcerra |
| Attendee Choice |
Coming to terms with Burn-In sockets |
James Tong - Texas Instruments |
Best
Poster |
Low Cost / Low Profile Spring Probe |
Samuel Pak - IWIN Co., Ltd. |
BiTS 2017 was a great event with the right mix of learning, exploring, and sharing. Thanks again to all the authors of the thirty-two technical presentations and nineteen posters for the high quality technical content which provided the learning! The BiTS EXPO provided plenty to explore by showcasing what is Now & Next in test. And there was plenty of sharing during the meals, networking breaks, and the Social Event.
The largest thank you goes to all the attendees that made BiTS 2017 a success! More than 240 test engineers and managers Professional Attendees represented not only a broad geographic mix, but also spanned the semiconductor process, from fabless/foundry to OSAT... and in between. In total, more than 400 people participated in this year’s event.
The final versions of all of the of BiTS 2017 presentations and posters delivered by suppliers, end-users, and engineering professionals are now available in the Premium Archive. In addition to the presentation slides and posters in downloadable PDF format, the archive contains multimedia recordings of the presentations synchronized to the slides. BiTS 2017 Professional Attendees can now access all the multimedia from 2013 up to and including this year's event (2017).
Others may subscribe to the Premium Archive if you wish to view the multimedia or download the BiTS 2017 slides today. And the subscription fee will be fully credited towards your Professional Registration in 2018. Otherwise, the slides and posters from BiTS 2017 will be available for free download by everyone starting July 1.
BiTS returns to Mesa, Arizona on March 4-7, 2018. We look forward to seeing you there!
And please "pencil in" BiTS China for the week of September 4, 2017 in Shanghai. Once we confirm the exact date, we'll let you know.
Thank you for being part of the BiTS professional community!
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